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Engineering / Design / Education / Design for X / Electronics manufacturing / Test engineer / Post-silicon validation / Test / Reliability engineering / Turing test


Call for Papers International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design- fortest, design
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Document Date: 2015-10-25 02:05:23


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File Size: 144,68 KB

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