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Dielectric breakdown in electrically stressed thin films of thermal Si02 Eli Harari Newport Beach Research Center. Hughes Aircraft Company. Newport Beach. CaliforniaReceived 8 August 1977; accepted for publicatio
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Document Date: 2011-10-12 18:22:56
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Dielectric breakdown in electrically stressed thin films of thermal Si02 Eli Harari Newport Beach Research Center. Hughes Aircraft Company. Newport Beach. CaliforniaReceived 8 August 1977; accepted for publicatio