Characterization of CZT Crystals with Using of the Time-of-Flight Method V. Ivanov, L. Alekseeva, P. Dorogov, A. Loutchanski RITEC Ltd. 23 Aizkraukles St. office 407, Riga, LV-1006, Latvia Tel. Fax: , E-mail: - Riga - Document - PDFSEARCH.IO

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Date: 2013-12-27 11:15:56		Characterization of CZT Crystals with Using of the Time-of-Flight Method V. Ivanov, L. Alekseeva, P. Dorogov, A. Loutchanski RITEC Ltd. 23 Aizkraukles St. office 407, Riga, LV-1006, Latvia Tel./Fax: +, E-mail: Add to Reading List Source URL: www.ritec.lv Download Document from Source Website File Size: 383,73 KB Share Document on Facebook