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Spectroscopy / Electromagnetic spectrum / X-rays / Scattering / Extreme ultraviolet lithography / Polymer physics / Small-angle X-ray scattering / X-ray fluorescence / Interference lithography / Electromagnetic radiation / Physics / Scientific method


SLS Symposium on Nanostructures and Nanoparticles Tuesday, May 13, [removed]:00 to 11:45, WBGB[removed]:00 Surface sensitive measurements on the nanometer scale by means of grazing emission X-ray fluorescence
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Document Date: 2015-02-03 08:51:10


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File Size: 1,74 MB

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City

Fribourg / Berlin / Villigen / Kielce / /

Company

Y. Ekinci Laboratory / Ge / /

Country

Poland / Germany / Switzerland / /

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Facility

Paul Scherrer Institute / Switzerland University of Fribourg / Institute of Physics / Jan Kochanowski University / /

IndustryTerm

chemical conditions / precise performance tool / softmatter systems / sample systems / micro-electronics industry / online monitor / resolution broadband mask technology / /

Organization

Institute of Physics / Switzerland University of Fribourg / Paul Scherrer Institut / Physics Department / Paul Scherrer Institute / /

Person

Nat / Jun Han / Andreas Menzel Paul Scherrer / Yves Kayser / /

Product

AuNPs / /

SportsLeague

Kielce / /

Technology

semiconductor / high-resolution broadband mask technology / Lithography / X-ray / /

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