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45 nanometer / Leakage / Field-effect transistor / Threshold voltage / Silicon on insulator / Electrical engineering / Electromagnetism / Materials science


Microsoft PowerPoint - GIDL_HWang_06232010v2 [Compatibility Mode]
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Document Date: 2010-08-24 11:10:56

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File Size: 410,64 KB

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IBM / /

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Terminal Currents / /

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same results Device / /

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45nm PDSOI technology / SOI technologies / simulation / /

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