![](https://www.pdfsearch.io/img/48efc12d192722932f1701c1e79aa26a.jpg) Date: 1998-11-17 10:20:00
| | Literaturverzeichnis [AK94] P. Asoka-Kumar, K.G. Lynn, D.O. Welch. Characterization of defects in Si and SiO2 -Si using positrons. J. Appl. Phys., 76(9):4935 – 4982, AK96] P. Asoka-Kumar, M. Alatalo, V.J. Ghosh,Add to Reading ListSource URL: sundoc.bibliothek.uni-halle.deDownload Document from Source Website File Size: 164,73 KBShare Document on Facebook
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