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Scientific method / Near-field scanning optical microscope / Raman spectroscopy / Graphene / Atomic force microscopy / Microscopy / Microscope / Magnetic force microscope / Piezoresponse force microscopy / Scanning probe microscopy / Chemistry / Science


Graphene Comprehensive AFM / Optical / Raman / TERS* Characterization in the Single Experiment White light image of the graphene flake with AFM tip and Raman laser spot
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Document Date: 2012-07-13 02:55:13


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File Size: 2,14 MB

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City

Moscow / /

Company

NT-MDT Co. / /

Country

Russia / United Kingdom / /

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Facility

University of Exeter / USA Building / The College of William / NT-MDT Co. Building / University of Lancaster / /

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IndustryTerm

ultrafast imaging / confocal imaging / imaging / software analysis / /

Organization

College of William & Mary / Center of Graphene Science / University of Lancaster / University of Exeter / /

Person

Raman Scattering Humidity Liquid Confocal / David W. Horsell / V. Gorbachev / Raman Scattering / Fluorescence Microscopy / Reflected Laser (Rayleigh) / Hannes Schniepp / /

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Position

Major / /

Technology

semiconductor / laser / Lasers / spectroscopy / heat transfer / lithography / /

URL

www.nano-science.com / www.ntmdt.com / www.renishaw.com/AFM-Raman / /

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