![Scientific method / Near-field scanning optical microscope / Raman spectroscopy / Graphene / Atomic force microscopy / Microscopy / Microscope / Magnetic force microscope / Piezoresponse force microscopy / Scanning probe microscopy / Chemistry / Science Scientific method / Near-field scanning optical microscope / Raman spectroscopy / Graphene / Atomic force microscopy / Microscopy / Microscope / Magnetic force microscope / Piezoresponse force microscopy / Scanning probe microscopy / Chemistry / Science](https://www.pdfsearch.io/img/6487a83a22f6ee07ea53ae9a8ce256c7.jpg) Date: 2012-07-13 02:55:13Scientific method Near-field scanning optical microscope Raman spectroscopy Graphene Atomic force microscopy Microscopy Microscope Magnetic force microscope Piezoresponse force microscopy Scanning probe microscopy Chemistry Science | | Graphene Comprehensive AFM / Optical / Raman / TERS* Characterization in the Single Experiment White light image of the graphene flake with AFM tip and Raman laser spotAdd to Reading ListSource URL: www.ntmdt.comDownload Document from Source Website File Size: 2,14 MBShare Document on Facebook
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