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Date: 2012-12-28 07:31:35Chemistry Magnetic force microscope Microscopy Microscope Kelvin probe force microscope Atomic force microscopy Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method | Flexible integrated research AFM OPEN is a fully automated desktop AFM. It is much more than just topography imaging tool. Coupled with PX Ultra controller, the OPEN provides the largest suite of AFM measuring techniquAdd to Reading ListSource URL: www.ntmdt.ruDownload Document from Source WebsiteFile Size: 1,83 MBShare Document on Facebook |
Microscopy: Science, Technology, Applications and Education A. Méndez-Vilas and J. Díaz (Eds.) ______________________________________________ Measuring dielectric properties at the nanoscale using Electrostatic Force MDocID: 1b1MA - View Document | |
Photon Factory Activity Report 2011 #B 7C/2009G567 XANAM with Quartz tuning fork cantilever Shushi SUZUKI*1, Shingo MUKAI2, Wang Jae CHUN4, Masaharu NOMURA3,DocID: 18Lc9 - View Document | |
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Nanosurf FlexAFM Your Versatile Research AFM for Materials & Life Science t Measurement capabilities in air and liquid t Versatility in applications and modes t Compatibility with inverted microscopesDocID: 18f5k - View Document | |
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