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Scientific method / Atomic force microscopy / AFM probe / Microscopy / Measuring instrument / Kelvin probe force microscope / Magnetic force microscope / Scanning probe microscopy / Science / Chemistry


Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA
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Document Date: 2013-10-09 06:55:25

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File Size: 1,39 MB

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Company

Local Dielectric Studies NT-MDT Development Inc. / /

IndustryTerm

electronics / metal layer / /

Position

researcher / novel electronic controller / /

RadioStation

KFM / /

Technology

phase modulation / amplitude modulation / frequency modulation / dielectric / semiconductors / simulation / /

URL

www.ntmdt.com / www.ntmdt-tips.com / /

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