AFM Raman Microscopy SNOM Tip-Enhanced Raman: Instrumentation and Applications P. Dorozhkin,* E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov NT-MDT Co., Build. 100, Zelenograd Moscow, [removed]Russia * dorozhkin - AFM probe - Document - PDFSEARCH.IO

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Date: 2012-07-13 02:47:38 Scientific method Microscopy Near-field scanning optical microscope Raman spectroscopy Atomic force microscopy Microscope Optical microscope Magnetic force microscope Graphene Science Scanning probe microscopy Chemistry		AFM + Raman Microscopy + SNOM + Tip-Enhanced Raman: Instrumentation and Applications P. Dorozhkin,* E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov NT-MDT Co., Build. 100, Zelenograd Moscow, [removed]Russia * dorozhkin Add to Reading List Source URL: www.ntmdt.com Download Document from Source Website File Size: 1,01 MB Share Document on Facebook

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