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Date: 2015-02-19 03:40:30Scanning probe microscopy Spectroscopy Microscopy Intermolecular forces Raman spectroscopy Laboratory techniques Chemical imaging Raman scattering Atomic force microscopy Scientific method Science Chemistry | Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 NT-MDT America, Tempe, AZ U.S.A. 2Add to Reading ListSource URL: ntmdt.comDownload Document from Source WebsiteFile Size: 3,14 MBShare Document on Facebook |
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