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Date: 2015-03-16 03:01:49Chemistry Atomic force microscopy Microscopy Scanning tunneling microscope Microscope Vibrational analysis with scanning probe microscopy Magnetic force microscope Scanning probe microscopy Science Scientific method | High-Resolution Imaging in Different Atomic Force Microscopy Modes John Alexander and Sergei Magonov NT-MDT Development Inc. Tempe AZ USA • A n operation of AFM microscope in a temperaturestable cabinet facilitatesAdd to Reading ListSource URL: ntmdt.comDownload Document from Source WebsiteFile Size: 2,13 MBShare Document on Facebook |
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