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Park Systems / Scanning probe microscopy / Intermolecular forces / KLA Tencor / Atomic force microscopy / Hard disk drive / Nanotechnology / Computer hardware / Science / Technology


Automatic Defect Review AFM for Hard Disk Media and Substrates Nanotechnology Solutions Partner For more information: www.parkAFM.com
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Document Date: 2011-11-12 18:00:00

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File Size: 125,43 KB

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City

Santa Clara / /

Company

KLA Tencor / HDD Industry Park Systems / Park Systems Inc. / /

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IndustryTerm

hard disk media / imaging / automated nanotechnology measurement solutions / software correction / /

Organization

state-of the-art nanotechnology solution service / /

Person

Candela Throughput / /

/

ProvinceOrState

California / /

Technology

disk drive / /

URL

www.parkAFM.com / /

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