Back to Results
First PageMeta Content
Chemistry / Atomic force microscopy / Magnetic force microscope / Microscopy / Conductive atomic force microscopy / Scanning capacitance microscopy / Nanoindentation / Scanning tunneling microscope / Microscope / Scanning probe microscopy / Science / Scientific method


Dimension FastScan The World’s Fastest AFM Innovation with Integrity
Add to Reading List

Document Date: 2013-10-28 06:25:22

Open Document

File Size: 4,16 MB

Share Result on Facebook

City

Santa Barbara / Basel / /

Company

Bruker Corporation / FastScan NanoScope Software / /

Country

Switzerland / /

/

Facility

Stable High / /

IndustryTerm

extreme imaging speed / high-bandwidth electronics / fluid applications / typical imaging / platform technology / electronics / measurement automation software / manufacturing / chemical / imaging / /

Organization

U.S. Securities and Exchange Commission / /

Person

VITA EH / /

/

Position

controller / /

Product

FastScan AFM System / TappingMode / PhaseImaging / NanoScope / HarmoniX / LiftMode / ScanAsyst / PeakForce QNM / /

ProgrammingLanguage

V / /

ProvinceOrState

Nebraska / /

Technology

laser / broadband / Spectroscopy / lithography / lowest drift tip-scanning AFM platform technology / digital camera / AFM technology / /

URL

www.bruker.com / www.bruker-axs.com / /

SocialTag