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Microbiology / Atomic force microscopy / Magnetic force microscope / Microscopy / Piezoresponse force microscopy / Microscope / Scanning capacitance microscopy / AFM probe / Bruker / Scanning probe microscopy / Science / Scientific method


Document Date: 2013-10-28 06:25:22

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City

Santa Barbara / /

Company

Bruker Corporation / Vanadium / BASF / /

Country

France / United Kingdom / /

/

Facility

University of Sheffield / University of North Carolina / Chapel Hill / University of PAU / /

IndustryTerm

conventional phase imaging / electronics / life science applications / resolution imaging / imaging / energy / /

OperatingSystem

Integrity / /

Organization

University of Sheffield / Northwestern University / University of North Carolina / Chapel Hill / /

Person

Peter Adams / Natalia Erina / Stefan Kaemmer / Neil Hunter / Daniel Müller / Chunzeng Li / /

/

Position

sales manager / Major / General / controller / /

Product

TappingMode / PeakForce TUNA / ScanAsyst / PeakForce QNM / /

ProgrammingLanguage

EC / C / /

ProvinceOrState

North Carolina / /

PublishedMedium

Applied Physics Letters / /

Technology

laser / Peak Force Tapping technology / spectroscopy / http / image processing / Electrochemistry / Peak Force Tapping™ technology / /

URL

www.BrukerAFMprobes.com / www.bruker.com / /

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