<--- Back to Details
First PageDocument Content
Chemistry / Atomic force microscopy / Piezoelectricity / Vibrational analysis with scanning probe microscopy / Scanning probe microscopy / Scientific method / Science
Date: 2009-12-22 18:00:00
Chemistry
Atomic force microscopy
Piezoelectricity
Vibrational analysis with scanning probe microscopy
Scanning probe microscopy
Scientific method
Science

True Non-Contact Mode vs. Tapping Imaging Tapping Imaging is Merely a Compromise Between Contact and NC-AFM The Non-Contact Mode AFM The first Non-Contact mode AFM (NC-AFM) was developed by Martin et al in 1987,1. In NC-

Add to Reading List

Source URL: www.nanowerk.com

Download Document from Source Website

File Size: 412,67 KB

Share Document on Facebook

Similar Documents