Date: 2009-12-22 18:00:00Chemistry Atomic force microscopy Piezoelectricity Vibrational analysis with scanning probe microscopy Scanning probe microscopy Scientific method Science | | True Non-Contact Mode vs. Tapping Imaging Tapping Imaging is Merely a Compromise Between Contact and NC-AFM The Non-Contact Mode AFM The first Non-Contact mode AFM (NC-AFM) was developed by Martin et al in 1987,1. In NC-Add to Reading ListSource URL: www.nanowerk.comDownload Document from Source Website File Size: 412,67 KBShare Document on Facebook
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