RESEARCH NEWS Nanomanipulation by Atomic Force

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Date: 2006-01-11 10:36:52 Chemistry Atomic force microscopy Local oxidation nanolithography NanoWorld AFM probe Scanning tunneling microscope Microscopy Nanotechnology Optical microscope Scanning probe microscopy Science Materials science		RESEARCH NEWS Nanomanipulation by Atomic Force Add to Reading List Source URL: www.nano-science.de Download Document from Source Website File Size: 233,61 KB Share Document on Facebook

	Application Note In-situ Scanning Electron Microscope (SEM) supplements Scanning Probe Microscopy (SPM) DocID: 1uSmr - View Document
	SPM Open Source Controller Model Mk2-A810 This DSP-based system has been specially designed to meet the Scanning Probe Microscopy (SPM) application requirements. The SPM Open Source Controller offers: 8 analog I/O capab DocID: 1t8Qa - View Document
	HIGH RESOLUTION SCANNING PROBE MICROSCOPY OF BIONANOSTRUCTURES Klinov D.V.1,2 1 Russian Institute of Physico-Chemical Medicine, 119992, Moscow, Malaya Pirogovskaya 1a, DocID: 1rC2g - View Document
	articles Discrete interactions in cell adhesion measured by single-molecule force spectroscopy Martin Benoit†, Daniela Gabriel‡, Günther Gerisch‡ and Hermann E. Gaub DocID: 1rnem - View Document
	Technology Opportunity, Ref. No. UAA novel algorithm for phase computation in atomic force microscopy A novel algorithm has been developed which provides highly accurate phase measurements. In particular, the al DocID: 1rmSQ - View Document