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PointProbe® Plus XY-Alignment Series Silicon-SPM-Probes The XY-Alignment series comprises the well-established Alignment Chip with especially designed XY-Alignment probes enabling an easy and precise tip autoalignment.
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City
Neuchâtel /
/
Country
Switzerland /
/
/
IndustryTerm
holder chip /
topography imaging /
series allowing applications /
contact mode applications /
/
Organization
Electrostatic Force /
/
/
Position
AFM head /
/
Technology
laser /
holder chip /
Alignment Chip /
/
URL
www.nanosensors.com /
/
SocialTag
Technology
Materials science
Nanosensors
Magnetic force microscope
AFM probe
Electrostatic force microscope
Microscopy
Cantilever
Nanotechnology
Scanning probe microscopy
PointProbe® Plus XY-Alignment Series Silicon-SPM-Probes The XY-Alignment series comprises the well-established Alignment Chip with especially designed XY-Alignment probes enabling an easy and precise tip autoalignment.