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Scanning probe microscopy / Microscopy / Chemistry / AFM probe / Atomic force microscopy / Scanning electron microscope / Nanosensors / Scientific method / Science / Nanotechnology


Document Date: 2012-11-22 21:57:14

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Company

Terms & Conditions Park Systems / Probes Fit All Commercial AFM Systems Agilent Technologies / Veeco Instruments / Hitachi / Applied NanoStructures Inc. / /

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Facility

University of Connecticut / FORT Force / /

IndustryTerm

metal coatings / probe chips / alignment chips / characterization services / Well-established silicon technology / close contact mode applications / probe chip / imaging / /

Organization

University of Connecticut / FORT Force / Plateau Probes Force / Ball Probes/Colloidal Probes Force / Huey AFM Lab / /

Person

Varun Vyas / Al Probe / Brian D. Huey / /

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Position

Major / General / /

ProvinceOrState

Connecticut / /

Technology

laser / silicon technology / alignment chips / probe chips / SRAM / AFM probe chip / probe chip / /

URL

www.appnano.com / /

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