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Chemistry / Nanotechnology / Near-field scanning optical microscope / Atomic force microscopy / SG postcode area / Microscopy / AFM probe / International Organization for Standardization / Scanning probe microscopy / Science / Scientific method


3rd Tri-National Workshop on Standards for Nanotechnology Documentary Standards Activity for Scanned Probe Microscopy: ISO TC201/SC9 and SG3: Guidelines for Image/Artifact
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Document Date: 2009-02-23 18:16:44

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File Size: 372,29 KB

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Company

SG2 / /

Country

United States / /

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Event

Employment Change / /

Facility

Physics University of Incheon / /

IndustryTerm

imaging / /

Organization

Physics University of Incheon / Jeongyong KIM Department / /

Person

Clifford / Dziomba / Seongmin Cho / Ronald Dixson / Ichimura / Itoh / Huang / Dal Hyun Kim / /

Position

SG3 Chair / NIST Chair / General / /

Technology

semiconductor / spectroscopy / /

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