<--- Back to Details
First PageDocument Content
Chemistry / Microscopy / Intermolecular forces / Nanotechnology / Atomic force microscopy / Optical microscope / Microscope / Cantilever / Photoconductive atomic force microscopy / Science / Scientific method / Scanning probe microscopy
Date: 2010-02-17 15:16:57
Chemistry
Microscopy
Intermolecular forces
Nanotechnology
Atomic force microscopy
Optical microscope
Microscope
Cantilever
Photoconductive atomic force microscopy
Science
Scientific method
Scanning probe microscopy

Microsoft Word - serri-fact-sheet-AFM.doc

Add to Reading List

Source URL: www.engineering.olemiss.edu

Download Document from Source Website

File Size: 76,17 KB

Share Document on Facebook

Similar Documents

UPB - INVESTIGACIÓN & DESARROLLO No 13, Vol. 1 : 56 – MICROSTRUCTURAL CHARACTERIZATION MIXTURES BY ATOMIC FORCE MICROSCOPY OF

DocID: 1ugz1 - View Document

Scanning probe microscopy / Intermolecular forces / Chemistry / Electronic engineering / Learning / Atomic-force microscopy / Microscopy / Phase-locked loop / Non-contact atomic force microscopy / Atomic force acoustic microscopy

Technology Opportunity, Ref. No. UAA novel algorithm for phase computation in atomic force microscopy A novel algorithm has been developed which provides highly accurate phase measurements. In particular, the al

DocID: 1rmSQ - View Document

Scanning probe microscopy / Chemistry / Biology / Cell biology / Force spectroscopy / Atomic-force microscopy / Cell adhesion / Leukocyte extravasation / Cell migration / Cell membrane / Cantilever / Microscopy

Methods–178 Contents lists available at SciVerse ScienceDirect Methods journal homepage: www.elsevier.com/locate/ymeth

DocID: 1rhji - View Document

Scanning probe microscopy / Intermolecular forces / Chemistry / Atomic-force microscopy / Learning / Scientific method / Interferometry / Cantilever / Colloidal probe technique / Scanning joule expansion microscopy

NANOSCOPY APPLICATION NOTE M05 Scanning Probe Microscopes for extreme Environments

DocID: 1r6wn - View Document

Chemistry / Materials science / Electromagnetic radiation / Microtechnology / Photolithography / Nanolithography / Photoresist / Electron-beam lithography / Mask / Ultraviolet / Resist / Atomic-force microscopy

Journal of Photochemistry and Photobiology A: Chemistry–154 Nanopatterning with conformable phase masks Joana Maria a , Seokwoo Jeon a , John A. Rogers a,b,∗ a

DocID: 1r33C - View Document