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Science / Materials science / Cantilever / Structural system / Atomic force microscopy / Silicon nitride / Scanning probe microscopy / Nanotechnology / Chemistry


Mini Round Robin on AFM Cantilever Spring Constant Calibration
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Document Date: 2009-06-24 07:05:27

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File Size: 350,03 KB

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City

Santa Barbara / Cantilever / Hayward / /

Company

National Physical Laboratory / /

/

Facility

National Institute of Standards and Technology / M. Lowe david.mendels@npl.co.uk National Institute / National Physical Laboratory / National Institute / /

IndustryTerm

transportation / test cantilever chips / reference cantilever chip / steel puck / cantilever chip / contact mode cantilever chips / proper handling tool / test chips / high technology materials / handle chip / cantilever chips / test chip / reference chip / Manufacturing processes / actual silicon chip / /

Organization

National Institute of Standards and Technology / National Institute for Materials Science / M. Lowe david.mendels@npl.co.uk National Institute for Materials Science / david.mendels@npl.co.uk National Institute for Materials Science / Advanced Nano Characterization Center / /

Person

David Mendels / /

Position

Nanoscope IIIa controller / author / /

ProvinceOrState

Maryland / /

PublishedMedium

Advanced Materials / /

Technology

reference chip / 3 Reference cantilever chip / reference cantilever chip / using cantilever chips / six contact mode cantilever chips / handle chip / six chips / ZHUH XVHG 7KH UHIHUHQFH FDQWLOHYHU chip / fracturing / test cantilever chips / actual silicon chip / Typical Test cantilever chip / test chips / test chip / /

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