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Chemistry / Atomic force microscopy / AFM probe / Cantilever / Microscopy / Near-field scanning optical microscope / Scanning tunneling microscope / Characterization / Microscope / Scanning probe microscopy / Science / Scientific method


Document Date: 2013-10-17 07:17:58

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Company

IBM / John Wiley & Sons Inc. / RI Dalia G. Yablon TE SurfaceChar LLC / MA CO / /

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electrical imaging / electronics / biological applications / thin metal coatings / calibration protocols / force microscopy software / active pharmaceutical ingredient / software packages / similar scale devices / characterization tool / industrial applications / Optical detection systems / imaging / consumer products / Image processing / image processing tools / recent groundbreaking work imaging / things accounting / /

Person

Gerd Binnig / Christoph Gerber / Heinrich Rohrer / Cal Quate / Sharon / Dalia G. Yablon / /

Position

researcher / representative / position-sensitive director / electronics controller / /

Technology

semiconductor / laser / Image processing / API / calibration protocols / /

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