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Embedded systems / IEEE standards / Technology / Joint Test Action Group / Boundary scan / Microcontrollers / In-circuit test / Atmel AVR / Electronics manufacturing / Manufacturing / Electronics
Date: 2014-03-17 07:54:31
Embedded systems
IEEE standards
Technology
Joint Test Action Group
Boundary scan
Microcontrollers
In-circuit test
Atmel AVR
Electronics manufacturing
Manufacturing
Electronics

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