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Survival analysis / Science / Vertical-cavity surface-emitting laser / Reliability / Failure rate / Accelerated aging / Burn-in / Mean time between failures / Light-emitting diode / Systems engineering / Reliability engineering / Failure


Reliability Report V25-850 VCSEL _short version_
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Document Date: 2014-04-23 09:28:40

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File Size: 234,49 KB

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City

Berlin / /

Company

VI Systems GmbH / VCSEL Reliability Report Introduction VI Systems GmbH / /

IndustryTerm

activation energy / energy efficiency / energy / /

Organization

JEDEC Solid State Technology Association / /

ProgrammingLanguage

C / /

Technology

8015 8020 8025 18010 8030 18015 18020 18025 18030 Chip Number Chip / 100 8010 8015 8020 8025 8030 Chip / /

URL

www.vwww.v-i-systems.com / /

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