| Document Date: 2013-03-06 23:17:30
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City Orlando / / Company Dell / Perot / Vaisala Oyj / Photonics Inc / / Country United States / / / IndustryTerm filter technologies / spectral measurement applications / real-time testing / agricultural applications / technology development / manufacturing techniques / chemical imaging / integrated microspectrometer-on-chip / microelectromechanical systems / chemical imaging spectrometer / space applications / push-broom chemical imaging systems / telecom applications / low temperature processing / The complete device / gas sensor / metal layer alternatives / / Organization European Space Agency / International Society for Optical Engineering / / / ProgrammingLanguage FL / / PublishedMedium Physica Scripta / Optics Communications / Proceedings of SPIE / / Technology microelectromechanical systems / MEMS / VTT FPI technology / dielectric / filter technologies / Monolithically integrated microspectrometer-on-chip / /
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Fabry-‐Perot
Interferometer
Background