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Technology / Electronics / SONOS / Flash memory / EPROM / Redox / Floating Gate MOSFET / Nanoelectronics / MOSFET / Non-volatile memory / Computer memory / Electrical engineering


IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 61, NO. 6, JUNEOptimization and Evaluation of Variability in the Programming Window of a Flash Cell With
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Document Date: 2014-07-03 06:39:22

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File Size: 2,82 MB

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