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Science / Emission spectroscopy / Photoemission spectroscopy / Polymer / Allyl / Electron spectroscopy / X-ray / Chemistry / Spectroscopy / Electromagnetic radiation


Surface and Interface 13C, 18B/2002G292 Non-destructive chemical depth-profiling by variable excitation energy XPS: TFAA derivatized allyl alcohol - ethylene plasma polymer films
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Document Date: 2010-01-05 10:30:05

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City

Berlin / /

Company

Surface Science Instruments Inc. / /

Country

Germany / Japan / /

/

Facility

Metrology Institute of Japan / Federal Institute / National Institute of Advanced Industrial / /

IndustryTerm

variable excitation energy / in-depth chemical state information / plasma processing / chemical depth profiling / photon energy / chemical depth-profiling / kinetic energy / energy range / energy / /

Movie

Iris RETZKO1 / Renate MIX1 / Sufal SWARAJ1 / Wolfgang E.S / /

Organization

Federal Institute for Materials Research and Testing / National Institute of Advanced Industrial and Science Technology / Metrology Institute of Japan / /

Technology

spectroscopy / x-ray / /

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