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Statistics / Electronic engineering / Scattering parameters / Decision theory / Electronics / X86 instructions / Non-standard RAID levels / Potentially all pairwise rankings of all possible alternatives / Design of experiments / Orthogonal array testing / Survival analysis
Date: 2011-01-03 03:00:48
Statistics
Electronic engineering
Scattering parameters
Decision theory
Electronics
X86 instructions
Non-standard RAID levels
Potentially all pairwise rankings of all possible alternatives
Design of experiments
Orthogonal array testing
Survival analysis

Classic algorithms for Pairwise Testing Andreas Rothmann Hochschule Offenburg November 2008

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