![Chemometrics / Linear regression / Principal component analysis / Ordinary least squares / Least squares / Degrees of freedom / Orthogonality / Variance / Statistics / Regression analysis / Partial least squares regression Chemometrics / Linear regression / Principal component analysis / Ordinary least squares / Least squares / Degrees of freedom / Orthogonality / Variance / Statistics / Regression analysis / Partial least squares regression](https://www.pdfsearch.io/img/920dc3cf370306525cb2da0208a26181.jpg)
| Document Date: 2006-02-15 15:59:14 Open Document File Size: 176,40 KBShare Result on Facebook
City Kvalheim / New-Haven / / Company Wiley InterScience / John Wiley & Sons Ltd. / Amax / / Country United States / / / Facility Yale University / / IndustryTerm dot products / partial least-squares algorithm / spectroscopic applications / multivariate algorithms / actual systems / dot product / regression algorithms / chemical interpretation / multi component systems / important and common applications / chemometrics regression tools / proposed new algorithms / basic tool / / Organization Department of Mathematics / Nadler* and Ronald R. Coifman Department of Mathematics / Yale University / / Person Ronald R. Coifman / Haaland / Boaz Nadler / Thomas E. Partial / Frederick Warner / / Position specific probabilistic model for the relation between x and y / analytical chemist / Butler / probabilistic model for data samples / Analyst / / Product Pentax K-x Digital Camera / / ProgrammingLanguage R / / ProvinceOrState Connecticut / / Technology PLS algorithm / partial least-squares algorithm / ANALYSIS OF THE PLS ALGORITHM / HLA algorithm / regression algorithms / spectroscopy / simulation / sample PLS algorithm / Therefore preprocessing algorithms / / URL www.interscience.wiley.com / /
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