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Integrated circuits / Design for X / Semiconductor device fabrication / Packaging / Reliability engineering / Survival analysis / Built-in self-test / Application-specific integrated circuit / NXP Semiconductors / Technology / Electronic engineering / Design


Project result CT302 I Towards one European test solution [TOETS] A testing dilemma As semiconductor chip
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Document Date: 2014-07-21 10:33:01

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City

Paris / /

Company

ATMEL / Manufacturing Partners / Ericsson / NXP Semiconductors / /

Continent

Europe / /

Country

United States / /

/

Facility

Star Salland STMicroelectronics ST-Ericsson Supelec Temento TIMA Tomorrow Options University / /

IndustryTerm

chip technology / communications technology industry / test equipment / test solution / nano-/microelectronic solutions / test solutions / final integrator / sensor applications / digital test equipment / heterogeneous systems / test programme development tools / manufacturing / healthcare / digital test applications / value chain / test tool / Supply test services / on delivering nano-/microelectronic solutions / /

Organization

University of Twente / CATRENE Office / /

Person

Kees Veelenturf / /

/

Position

Project leader / /

Product

F-75014 Paris / /

Technology

semiconductor / chip design / security Energy efficiency Digital lifestyle Design technology / system-on-chip / JTAG / chip technology / simulation / integrated circuit / /

URL

www.catrene.org / /

SocialTag