Newark / Veldhoven / Toronto / Los Alamitos / Metrics / /
Company
IBM / Oxford University Computing Laboratory / Baxter / IEEE Computer Society Press / The Netherlands ASML Netherlands B.V. / /
Country
Germany / Netherlands / Canada / / /
Facility
University of Delaware / Embedded Systems Institute / Delft University of Technology / University of Toronto / Computer Science Research Institute / University of California / /
IndustryTerm
software system / lithography systems / automatic aspect mining / clone detection algorithm / clone detection algorithms / detection tools / Aspect-oriented software development / text-based mining / software evolution using clone detection / software component / selection algorithm / large software systems / software system using metrics / clone detection tools / developers in evolving their applications / text-based and type-based mining / Type-based mining / mining / industrial software component / prototype tools / aspect mining / clone detection tool / software architecture / aspect mining problem / /
OperatingSystem
FreeBSD / /
Organization
Department of Computer and Information Sciences / IBM Centre for Advanced Studies Conference / Delft University of Technology / Computer Science Research Institute / Department of Computer Science and Engineering / University of Delaware / Embedded Systems Institute / Oxford University / University of Toronto / CWI / University of California / San Diego / /
Person
Mike Feeley / Stanley M. Sutton / Toshihiro Kamiya / Yvonne Coady / Jens Krinke / Serge Demeyer / Tom Tourw / Lori Pollock / Raghavan Komondoor / Gregor Kiczales / Filip Van Rysselberghe / Greg Smolyn / William Harrison / Mathieu Verbaere / Shinji Kusumoto / Silvia Breu / Katsuro Inoue / Brenda S. Baker / Susan Horwitz / David Sheperd / Harold Ossher / Peri Tarr / Matthias Rieger / Jan Hannemann / Emily Gibson / /
An Evaluation of Clone Detection Techniques for Identifying Crosscutting Concerns Magiel Bruntink, Arie van Deursen∗, Tom Tourw´e Remco van Engelen