Copyright © 2012 American Scientiﬁc Publishers All rights reserved Printed in the United States of America Journal of Low Power Electronics

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Date: 2012-11-06 11:44:32 Electronic engineering Electromagnetism Electronics Integrated circuits Electronic design automation Electronic design Semiconductor device fabrication Hardware Trojan Automatic test pattern generation Electromigration Reliability engineering Negative-bias temperature instability		Copyright © 2012 American Scientiﬁc Publishers All rights reserved Printed in the United States of America Journal of Low Power Electronics Add to Reading List Source URL: euler.ecs.umass.edu Download Document from Source Website File Size: 2,22 MB Share Document on Facebook

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