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Electromagnetism / IEEE Electron Devices Society / International Electron Devices Meeting / Institute of Electrical and Electronics Engineers / Integrated circuit / Laser diode / Reliability engineering / Hot carrier injection / Symposium on VLSI Circuits / Semiconductors / Electronic engineering / Engineering


E LECTRON DEVICES S OCIETY IEEE ELECTRON DEVICES SOCIETY OctVol. 10, No. 4
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Document Date: 2012-02-07 15:25:18

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File Size: 1,60 MB

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