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Electromagnetism / IEEE Electron Devices Society / Institute of Electrical and Electronics Engineers / IEEE Transactions on Semiconductor Manufacturing / International Electron Devices Meeting / Chenming Hu / Ilesanmi Adesida / Hot carrier injection / Reliability engineering / Semiconductors / Engineering / Electronic engineering


E LECTRON DEVICES S OCIETY IEEE ELECTRON DEVICES SOCIETY JanVol. 11, No. 1
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Document Date: 2012-02-07 15:25:14

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File Size: 320,62 KB

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