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Spectroscopy / Scanning probe microscopy / Infrared spectroscopy / Fourier transform infrared spectroscopy / Atomic force microscopy / Microscopy / Infrared / X-ray photoelectron spectroscopy / Attenuated total reflectance / Chemistry / Science / Scientific method


Document Date: 2011-02-11 05:50:51

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Milan / London / Ossining / /

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Feldman LC / Gurevich AB / Dilute Fluoride Solutions / Sigma Aldrich / Bio-RAD / RCA / /

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Italy / /

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Product Issues / /

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Color bar / /

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field-effect devices / thermal processing / chemical homogeneity / vol. solution / chemical routes / appropriate chemical procedure / chemical termination / local chemical structure / chemical removal / chemical state / software version / chemical configuration / gas treatment / rationale to surface protocols / device-quality processing / piranha solution / technology node / chemical configurations / aqueous solution / chemical population / chemicals / less extreme applications / wet-chemical treatment / nanotechnological applications / /

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IR / /

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Electrochemical Society / /

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Sugita Y. Appearance / /

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sites / /

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Applied Physics Letters / Japanese Journal of Applied Physics / Journal of Chemical Physics / Chemical Physics Letters / Surface and Interface Analysis / Journal of Physical Chemistry A / /

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Mirabella FM / /

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radiation / broadband / x-ray / spectroscopy / optoelectronics / /

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