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Spectroscopy / Science / Neutron scattering / X-ray spectroscopy / X-ray fluorescence / SPECTRO Analytical Instruments / XRF / International Centre for Diffraction Data / Neutron diffraction / Chemistry / Physics / Diffraction


Electron Backscatter Diffraction Texture Introduction to Modulated Structures Line Profile Analysis Rietveld Quantifying Crystalline and Amorphous Phases - Full Day
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Document Date: 2014-02-10 15:09:05


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File Size: 700,16 KB

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Dave Bish / John L. (Iain) Campbell / W. Tim Elam / Urbana Champain / Ion Batteries / /

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XRF Chair / speaker / General XRD Rietveld Analysis Chair / Trace Analysis Chair / jaanzelmo@aol.com Co-chair / Analysis Chair / China Quantitative / Chair / Spain Micro XRF / XRD Stress Analysis Chair / Invited Speaker / Nanomaterials Characterization Chair / Chair / peter.hoghoj@xenocs.com Co-chair / Rechargeable Battery Characterization Chair in X-ray Analysis / Applied Material Analysis Chair / /

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