![Atomic physics / Fluorescence / Molecular physics / Scattering / X-ray fluorescence / Fluorescence spectroscopy / Raman scattering / Stanford Synchrotron Radiation Lightsource / Ionizing radiation / Physics / Chemistry / Spectroscopy Atomic physics / Fluorescence / Molecular physics / Scattering / X-ray fluorescence / Fluorescence spectroscopy / Raman scattering / Stanford Synchrotron Radiation Lightsource / Ionizing radiation / Physics / Chemistry / Spectroscopy](https://www.pdfsearch.io/img/d875348a44ab1d778ffe3e0ba4de19a1.jpg) Date: 2003-04-14 02:31:07Atomic physics Fluorescence Molecular physics Scattering X-ray fluorescence Fluorescence spectroscopy Raman scattering Stanford Synchrotron Radiation Lightsource Ionizing radiation Physics Chemistry Spectroscopy | | Investigation of Na impurities on Si wafer surfaces using TXRF K. Baur*, A. Singh*, J. Wang+ , J. Kerner++ and P. Pianetta* *Stanford Synchrotron Radiation Laboratory, Stanford University, Stanford, CA 94309 + Balazs AnaAdd to Reading ListSource URL: www-project.slac.stanford.eduDownload Document from Source Website File Size: 58,74 KBShare Document on Facebook
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