Berkeley Design Automation Statistical Process Corners for Nm-Scale AMS GSA AMS Working Group November 14, 2012

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Date: 2014-01-22 10:43:04 Statistics Measurement Noise Natural process variation Quality control Process corners Effective number of bits Electromagnetism DBc Digital signal processing Electronics Integrated circuits		Berkeley Design Automation Statistical Process Corners for Nm-Scale AMS GSA AMS Working Group November 14, 2012 Add to Reading List Source URL: www.gsaglobal.org Download Document from Source Website File Size: 240,87 KB Share Document on Facebook

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