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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Electric Field and Strain Effects on Surface Roughness Induced Spin Relaxation in Silicon Field-Effect Transistors Dmitri Osintsev, Oskar Baumgartner, Zlatan Stanojevic,
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Document Date: 2013-02-12 08:39:11
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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Electric Field and Strain Effects on Surface Roughness Induced Spin Relaxation in Silicon Field-Effect Transistors Dmitri Osintsev, Oskar Baumgartner, Zlatan Stanojevic,