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Electronics / Joint Test Action Group / Boundary scan / Design for testing / Field-programmable gate array / Booting / Atmel AVR / In-circuit test / Electronics manufacturing / Manufacturing / Electronic engineering


www.xjtag.com XJDeveloper Key Benefits Overview
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Document Date: 2014-03-27 05:49:49

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XJEase library / /

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passive devices / real time / test systems / memory chip / logic devices / software experience / manufacturing / device manufacturer / it easy to use devices / /

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Visual Basic / /

Technology

design verification / Ethernet / flash / JTAG / memory chip / Flash memory / /

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www.xjtag.com / /

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