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Date: 2014-01-08 03:14:22 Electronic engineering Embedded systems IEEE standards Joint Test Action Group Boundary scan Debugger Field-programmable gate array Electrical connector Atmel AVR Electronics manufacturing Manufacturing Electronics		www.xjtag.com XJAnalyser Overview Add to Reading List Source URL: www.etoolsmiths.com Download Document from Source Website File Size: 231,97 KB Share Document on Facebook

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