Three Component Carriers Aeroflex Limited / Agilent / Additional Article Summaries Reconfigurable Real-Time Hardware / Joint Test Action Group / New Automated Testing Technologies / Field Agilent Technologies Inc. / /
Country
United States / United Kingdom / /
Event
FDA Phase / /
Facility
St. Louis Art Museum / University of Surrey / Missouri Botanical Garden / /
IndustryTerm
control algorithms / test systems / Wireless Channel Interference Problems / radar systems / distributed processing / serial protocols / automated test systems / verification tools / power electronics analysis / bandwidth-limiting signal processing / automated test equipment / manufacturing test applications / software suites / satellite systems / technology research program / combination analyzer solution / coaxial networks / as promised on their network / carrier aggregation / reconfigurable software-defined radio receiver / dedicated application solutions / relevant and comprehensive services / manufacturing test / bandwidth services / software architecture / wireless devices / military operating systems / /
Organization
IEEE Instrumentation and Measurement Society / IMS Chapter / AdCom / Outstanding Chapter / Aerospace & Electronics Systems Society / IEEE Aerospace and Electronic Systems Society / Measurement Society / IEEE Aerospace & Electronics Systems Society / 5G Innovation Centre / University of Surrey / Membership Development Committee / /
Person
Daniel Brateris / Robert R. Krchnavek / Reza Zoughi / Nikhil Adnani / Mathieu Lamanque / Tim Hember / Ian Ward / Dwight Bedford / Anthony Samaritano / Aaron Johnson / Laszlo Kovacs / Simona Salicone / Wendy van Moer / David Murray / Justin Reda / Bryan Kibble / Mohammad Farhan / Ian Robinson Stop / David Calhoun / Tarek Helaly / Thomas Mukalian / Reza Robert / Jochen Wolle / Robert P. Lyons / Jr. / /
Position
VP / Editor / President / This Editor / VP of MDCom / author / Chair / Representative / controller / by significant distances / /
The IEEE Instrumentation & Measurement Magazine August 2014 Issue A Sample of Innovations from AUTOTESTCON 2013 Jointly presented by the IEEE Instrumentation & Measurement and IEEE Aerospace & Electronic Systems Societie