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	Design Verification & Testing Design for Testability and Scan CMPE 418 Add to Reading List Document Date: 2004-12-01 12:51:01 Open Document File Size: 292,22 KB Share Result on Facebook Position designer / / Technology Design Verification / / SocialTag Electronics manufacturing Electronic design Design for X Design for testing Scan chain Automatic test pattern generation Integrated circuits Boundary scan Digital electronics Electronic engineering

Design Verification & Testing Design for Testability and Scan CMPE 418Add to Reading List