Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University

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$Electron / Chemistry / Physics / Electron microscopy / Microscopy / Electron beam / Diffraction / Microscopes / Transmission electron microscopy / Multislice / Annular dark-field imaging / Electron diffraction$ Date: 2012-05-25 16:52:49 Electron Chemistry Physics Electron microscopy Microscopy Electron beam Diffraction Microscopes Transmission electron microscopy Multislice Annular dark-field imaging Electron diffraction		Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University Add to Reading List Source URL: jur.phy.uic.edu Download Document from Source Website File Size: 1,04 MB Share Document on Facebook

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