M/A-COM Technology Solutions / Dan Burkhard / M/A-COM Technology Solutions RF Power Products Group / /
IndustryTerm
power semiconductor technologies / semiconductor technology / large periphery device / satellite uplink / power device solutions / packaged transistor product / technology obsolescence / industrial and medical applications / metal migration / reliability systems / semiconductor technologies / power device technology / semiconductor devices / power semiconductor chip / power semiconductor devices / activation energy / energy / /
Position
Quality Manager / generally accepted failure driver / /
Product
SiBJT devices / SiBJT / /
ProgrammingLanguage
DC / ML / /
Technology
semiconductor / Microwave / GaN power semiconductor chip / Silicon Carbide semiconductor technology / Torrance CA Abstract As GaN power device technology / promising technology / previous semiconductor technologies / power semiconductor technologies / semiconductor devices / /
High Temperature, High Power RF Life Testing of GaN on SiC RF Power Transistors Brian Barr, Engineering Manager and Dan Burkhard, Quality Manager M/A-COM Technology Solutions RF Power Products Group, Torrance CA Abstract