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Nanotechnology / Intermolecular forces / Technology / Image scanner / Office equipment / Nanometrology / Atomic force microscopy / Canton of Neuchâtel / Vibrational analysis with scanning probe microscopy / Scanning probe microscopy / Science / Scientific method


Document Date: 2009-12-22 18:00:00

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user protocol / out-dated and inferior technology / imaging / tube scanner systems / nanometrology applications / adequate tool / software correction / software means / /

Position

biologist / mechanical engineer / manufacturing engineer / /

Technology

extremely detailed user protocol / out-dated and inferior technology / /

URL

www.parkAFM.com / /

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