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Chemistry / Atomic force microscopy / Microscopy / Magnetic force microscope / Scanning capacitance microscopy / Microscope / Nanolithography / Scanning tunneling microscope / Nanoindentation / Scanning probe microscopy / Scientific method / Science


Document Date: 2013-10-28 06:25:21

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Company

Bruker Corporation / /

/

Facility

Loma Linda University / Facility Requirements Vibration Isolation Vibration / /

IndustryTerm

electrical and electrochemical applications / automatic image optimization technology / in situ imaging / buffer solution / semiconductor devices / application solutions / turnkey solutions / software workflow / chemical bond / low-noise control electronics / electronics / real-time control / application-specific solutions / imaging / dopant profiling solution / /

Organization

School of Medicine / Loma Linda University / /

Person

Perry / /

/

Position

controller / /

Product

PeakForce Tapping / TappingMode / PhaseImaging / LiftMode / ScanAsyst / Edge / /

ProvinceOrState

California / /

Technology

FPGA / Laser / automatic image optimization technology / semiconductors / PeakForce Tapping technology / PeakForce Tapping™ technology / semiconductor devices / spectroscopy / SRAM / digital camera / /

URL

www.brukerAFMprobes.com / www.bruker.com / /

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