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Date: 2017-11-01 22:26:41 | OCVD 法によるダイヤモンド p-i-n ダイオードのキャリア寿命測定 Carrier lifetime in diamond p-i-n diode by Open Circuit Voltage Decay method (OCVD) ○ A. Traore1, A. Nakajima1, T. Makino1, D. KuwabaAdd to Reading ListSource URL: bukko.bk.tsukuba.ac.jpDownload Document from Source WebsiteFile Size: 145,49 KBShare Document on Facebook |